Simplified source control interface

ABSTRACT

A mass spectrometry system having a simplified control interface includes a processor and a memory. The memory includes instructions that when executed cause the processor to perform the steps of providing a user interface including a plurality of adjustment elements for adjusting at least one results effective parameter and at least one sample descriptive parameter; determining a plurality of instrument control parameters based on the at least one results effective parameter and the at least one sample descriptive parameter; and analyzing a sample while operating according to the plurality of instrument control parameters.

FIELD

The present disclosure generally relates to the field of massspectrometry including a simplified source control interface.

INTRODUCTION

Mass spectrometry is an analytical chemistry technique that can identifythe amount and type of chemicals present in a sample by measuring themass-to-charge ratio and abundance of gas-phase ions. Typically, ionsproduced in an ion source travel along a path from an ion source to amass analyzer. Obtaining an optimal result often requires adjustingnumerous settings that control the ion source, such as various gasflows, temperatures, current, and other items. This can often requirespecialized knowledge of the instrument and mass spectrometry. The arrayof settings can make the use of mass spectrometry intimidating to a userthat may be more knowledgeable about their sample and their datarequirements than the effect of individual instrument parameters ontheir data obtained. As such, there is a need for new systems andmethods to configure mass spectrometry instruments including asimplified source control interface.

SUMMARY

In a first aspect, a mass spectrometry system having a simplifiedcontrol interface can include a processor and a memory. The memory caninclude instructions that when executed cause the processor to performthe steps of: providing a user interface including a plurality ofadjustment elements for adjusting at least one results effectiveparameter or at least one sample descriptive parameter; determining aplurality of instrument control parameters based on the at least oneresults effective parameter and the at least one sample descriptiveparameter; and analyzing a sample while operating according to theplurality of instrument control parameters.

In various embodiments of the first aspect, the number of the determinedinstrument control parameters can be greater than the number of resultseffective parameters and sample descriptive parameters.

In various embodiments of the first aspect, the at least one resultseffective parameter can include desired sensitivity.

In various embodiments of the first aspect, the at least one sampledescriptive parameter can include volatility of a sample solvent orstability of a target compound.

In various embodiments of the first aspect, the instrument controlparameters can include nebulizing gas flow, desolvation gas flow, sweepgas flow, desolvation gas temperature, ion inlet temperature, sprayvoltage, source collision induced dissociation, or any combinationthereof.

In various embodiments of the first aspect, the adjustment elements caninclude sliders, knobs, or any combination thereof.

In a second aspect, a method for operating a mass spectrometry systemwith a simplified control interface can include providing a userinterface including a plurality of adjustment elements for adjusting atleast one results effective parameter or at least one sample descriptiveparameter; determining a plurality of instrument control parametersbased on the at least one results effective parameter and the at leastone sample descriptive parameter; and analyzing a sample while operatingaccording to the plurality of instrument control parameters.

In various embodiments of the second aspect, the number of thedetermined instrument control parameters can be greater than the numberof results effective parameters and sample descriptive parameters.

In various embodiments of the second aspect, the at least one resultseffective parameter can include desired sensitivity.

In various embodiments of the second aspect, the at least one sampledescriptive parameter can include volatility of a sample solvent orstability of a target compound.

In various embodiments of the second aspect, the instrument controlparameters can include nebulizing gas flow, desolvation gas flow, sweepgas flow, desolvation gas temperature, ion inlet temperature, sprayvoltage, source collision induced dissociation, or any combinationthereof.

In various embodiments of the second aspect, the adjustment elements caninclude sliders, knobs, or any combination thereof.

In a third aspect, a method for operating a mass spectrometry systemwith a simplified control interface can include receiving asensitivity/robustness setting, a solvent volatility setting, a compoundstability setting from a user, or any combination thereof, anddetermining a plurality of instrument control parameters based on thereceived settings. The plurality of instrument control parameters caninclude a nebulizing gas flow, a desolvation gas flow, a sweep gas flow,a desolvation gas temperature, an ion inlet temperature, or anycombination thereof. The method can further include setting the flowrates and/or temperatures of the mass spectrometry system in accordancewith the plurality of instrument control parameters.

In various embodiments of the third aspect, the number of the determinedinstrument control parameters is greater than the number of receivedsettings.

In a fourth aspect, a mass spectrometry system can include a processorand a memory. The memory can include instructions that when executedcause the processor to perform the steps of determining one or moreinstrument control parameters based upon a chromatographic liquid flowrate; providing a user interface including one or more adjustmentelements for adjusting at least one results effective parameter or atleast one sample descriptive parameter; adjusting the instrument controlparameters based on the at least one results effective parameter or atleast one sample descriptive parameter; and analyzing a sample whileoperating according to the plurality of instrument control parameters.

In various embodiments of the fourth aspect, the number of thedetermined instrument control parameters is greater than the number ofresults effective parameters and sample descriptive parameters.

In various embodiments of the fourth aspect, the at least one resultseffective parameter includes desired sensitivity.

In various embodiments of the fourth aspect, the at least one sampledescriptive parameter includes volatility of a sample solvent orstability of a target compound.

In various embodiments of the forth aspect, the instrument controlparameters include nebulizing gas flow, desolvation gas flow, sweep gasflow, desolvation gas temperature, ion inlet temperature, spray voltage,source collision induced dissociation, or any combination thereof.

In various embodiments of the fourth aspect, the adjustment elementsinclude sliders, knobs, or any combination thereof.

DRAWINGS

For a more complete understanding of the principles disclosed herein,and the advantages thereof, reference is now made to the followingdescriptions taken in conjunction with the accompanying drawings andexhibits, in which:

FIG. 1 is a block diagram of an exemplary mass spectrometry system, inaccordance with various embodiments.

FIG. 2 is a diagram of an exemplary electrospray ionization source, inaccordance with various embodiments.

FIGS. 3A and 3B are drawings illustrating exemplary selection elementsof a simplified source control interface, in accordance with variousembodiments.

FIGS. 4, 5, and 6 are exemplary graphs illustrating shifts in instrumentcontrol parameters as a result of settings of the selection elements, inaccordance with various embodiments.

FIG. 7 is a flow diagram illustrating exemplary methods of analyzing asample, in accordance with various embodiments.

FIG. 8 is a block diagram illustrating an exemplary computer system.

It is to be understood that the figures are not necessarily drawn toscale, nor are the objects in the figures necessarily drawn to scale inrelationship to one another. The figures are depictions that areintended to bring clarity and understanding to various embodiments ofapparatuses, systems, and methods disclosed herein. Wherever possible,the same reference numbers will be used throughout the drawings to referto the same or like parts. Moreover, it should be appreciated that thedrawings are not intended to limit the scope of the present teachings inany way.

DESCRIPTION OF VARIOUS EMBODIMENTS

Embodiments of systems and methods for ion isolation are describedherein and in the accompanying exhibits.

The section headings used herein are for organizational purposes onlyand are not to be construed as limiting the described subject matter inany way.

In this detailed description of the various embodiments, for purposes ofexplanation, numerous specific details are set forth to provide athorough understanding of the embodiments disclosed. One skilled in theart will appreciate, however, that these various embodiments may bepracticed with or without these specific details. In other instances,structures and devices are shown in block diagram form. Furthermore, oneskilled in the art can readily appreciate that the specific sequences inwhich methods are presented and performed are illustrative and it iscontemplated that the sequences can be varied and still remain withinthe spirit and scope of the various embodiments disclosed herein.

All literature and similar materials cited in this application,including but not limited to, patents, patent applications, articles,books, treatises, and internet web pages are expressly incorporated byreference in their entirety for any purpose. Unless described otherwise,all technical and scientific terms used herein have a meaning as iscommonly understood by one of ordinary skill in the art to which thevarious embodiments described herein belongs.

It will be appreciated that there is an implied “about” prior to thetemperatures, concentrations, times, pressures, flow rates,cross-sectional areas, etc. discussed in the present teachings, suchthat slight and insubstantial deviations are within the scope of thepresent teachings. In this application, the use of the singular includesthe plural unless specifically stated otherwise. Also, the use of“comprise”, “comprises”, “comprising”, “contain”, “contains”,“containing”, “include”, “includes”, and “including” are not intended tobe limiting. It is to be understood that both the foregoing generaldescription and the following detailed description are exemplary andexplanatory only and are not restrictive of the present teachings.

As used herein, “a” or “an” also may refer to “at least one” or “one ormore.” Also, the use of “or” is inclusive, such that the phrase “A or B”is true when “A” is true, “B” is true, or both “A” and “B” are true.Further, unless otherwise required by context, singular terms shallinclude pluralities and plural terms shall include the singular.

A “system” sets forth a set of components, real or abstract, comprisinga whole where each component interacts with or is related to at leastone other component within the whole.

Mass Spectrometry Platforms

Various embodiments of mass spectrometry platform 100 can includecomponents as displayed in the block diagram of FIG. 1. In variousembodiments, elements of FIG. 1 can be incorporated into massspectrometry platform 100. According to various embodiments, massspectrometer 100 can include an ion source 102, a mass analyzer 104, anion detector 106, and a controller 108.

In various embodiments, the ion source 102 generates a plurality of ionsfrom a sample. The ion source can include, but is not limited to, amatrix assisted laser desorption/ionization (MALDI) source, electrosprayionization (ESI) source, heated electrospray ionization (HESI) source,atmospheric pressure chemical ionization (APCI) source, atmosphericpressure photoionization source (APPI), inductively coupled plasma (ICP)source, electron ionization source, chemical ionization source,photoionization source, glow discharge ionization source, thermosprayionization source, and the like.

In various embodiments, the mass analyzer 104 can separate ions based ona mass to charge ratio of the ions. For example, the mass analyzer 104can include a quadrupole mass filter analyzer, a quadrupole ion trapanalyzer, a time-of-flight (TOF) analyzer, an electrostatic trap (e.g.,ORBITRAP) mass analyzer, Fourier transform ion cyclotron resonance(FT-ICR) mass analyzer, and the like. In various embodiments, the massanalyzer 104 can also be configured to fragment the ions using collisioninduced dissociation (CID) electron transfer dissociation (ETD),electron capture dissociation (ECD), photo induced dissociation (PID),surface induced dissociation (SID), and the like, and further separatethe fragmented ions based on the mass-to-charge ratio.

In various embodiments, the ion detector 106 can detect ions. Forexample, the ion detector 106 can include an electron multiplier, aFaraday cup, and the like. Ions leaving the mass analyzer can bedetected by the ion detector. In various embodiments, the ion detectorcan be quantitative, such that an accurate count of the ions can bedetermined.

In various embodiments, the controller 108 can communicate with the ionsource 102, the mass analyzer 104, and the ion detector 106. Forexample, the controller 108 can configure the ion source orenable/disable the ion source. Additionally, the controller 108 canconfigure the mass analyzer 104 to select a particular mass range todetect. Further, the controller 108 can adjust the sensitivity of theion detector 106, such as by adjusting the gain. Additionally, thecontroller 108 can adjust the polarity of the ion detector 106 based onthe polarity of the ions being detected. For example, the ion detector106 can be configured to detect positive ions or be configured todetected negative ions.

In various embodiments, the system can be coupled with a chromatographydevice 110. The chromatography device 110 can include a gaschromatograph (GC), a liquid chromatograph (LC), such as an HPLC or aUPLC, or the like. The chromatography device can separate components ofa sample according to the retention times of the individual componentswithin the column. In various embodiments, the chromatography column caninclude a material that interacts with at least some of the componentsof the sample. The interactions between the components and the columnmaterial can retard the flow of the components through the column,resulting in a retention time that is a function of the extent of theinteraction between the component and the column material. Theinteractions can be based on a size of the component, a hydrophobicityof the component, the charge of the component, an affinity of the columnmaterial for the component, or the like. As such, the column can atleast partially separate components of the sample from one another.

Electrospray Source

FIG. 2 is an exemplary heated electrospray source 200. Liquid sample,usually supplied from a chromatograph, is introduced through capillary202. A high voltage potential is applied to the end of capillary 202 tocause the liquid sample to form a Taylor Cone. Droplets are ejected fromthe Taylor cone and form a spray 204. Within the spray 204, dropletscontinue to break apart forming smaller and smaller droplets untilcomponents of the sample are ionized. A nebulizing gas flow 206 can besupplied to aid in droplet formation. An additional desolvation gas flow208 can be supplied to aid in vaporization of the solvent. Additionally,desolvation gas temperature can be controlled by a heater 210.

As the droplets shrink in size, fine droplets and gas phase ions 212 canbe drawn from the spray 204 and into an ion inlet. The flow of the finedroplets and gas phase ions 212 can be regulated by a sweep gas 214.Once in the ion inlet, the fine droplets and gas phase ions 212 cantravel down a transfer tube 216 to a mass analyzer (not shown). Thetransfer tube 214 can be heated to provide further desolvation of thefine droplets and gas phase ions 202 such that when they leave thetransfer tube 216, the flow consists essentially of neutral gasmolecules and gas phase ions. In various embodiments, source collisioninduced dissociation (CID) can occur at the exit of the transfer tube216 by accelerating the ions into the neutral gas resulting incollisions that remove adducts of the sample ions. The source CID can becontrolled by the velocity of the ions exiting the transfer tube 216which is regulated by the relative potentials of the ion transfer tubeand an ion lens (not shown).

Simplified Control Interface

FIG. 3A illustrates an exemplary user interface 300 including aplurality of sliders 302, 304, 306, 308, and 310. Slider 302 includes aselector 312, a slider track 314, and a plurality of position marks 316,318, 320, 322, and 324. Sliders 304, 306, 308, and 310 can includesimilar elements not numbered for simplicity. Slider 302 can set aresults effective variable, such as instrument robustness. Sliders 304,306, 308, and 310 can set sample descriptive parameters, such ascompound stability, propensity of a compound to form adducts, solventvolatility, or solvent conductivity.

FIG. 3B illustrates an exemplary user interface 350 including aplurality of knobs 352, 354, 356, 358, and 360. Knob 352 includes a dial362 and a plurality of position marks 364, 366, 368, 370, and 372. Knobs354, 356, 358, and 360 can include similar elements not numbered forsimplicity. Knob 352 can set a results effective variable, such asinstrument robustness. Knobs 354, 356, 358, and 360 can set sampledescriptive parameters, such as compound stability, propensity of acompound to form adducts, solvent volatility, or solvent conductivity.

In various embodiments, increasing the robustness can increase thenumber of consecutive runs that can be performed without cleaninginstrument components such as the ion transfer tube, ion inlet, and thelike. This can result in a higher utilization of the instrument, but candecrease sensitivity. It can be desirable to alternate between a morerobust setting for routine analysis of samples with a relatively higherconcentration of compounds of interest, and a less robust setting whenincreased sensitivity is needed for samples with a relatively lowerconcentration of compounds of interest. In various embodiments,increasing the robustness setting can increase a sweep gas flow.

In various embodiments, compound stability can describe the thermalstability of a compound of interest in a sample, or the propensity ofthe compound to degrade at high temperature. It can be desirable toavoid thermal degradation of the compound during and after ionformation, such as by reducing the ion inlet temperature.

In various embodiments, the propensity of a compound to form adducts candescribe the frequency of adduct formation and the number of potentialadducts a compound can form, such as with solvent molecules, salts, andother compounds. Increased adduct formation can complicate mass analysisand it can be desirable to reduce the number of adducts throughcollision induced dissociation near the source prior to furtheranalysis.

In various embodiments, solvent volatility can describe how quickly asolvent will vaporize or evaporate. For solvents with a lowervolatility, it can be desirable to increase the nebulization temperatureand increase the flow of nebulization gas and desolvation gas toincrease the rate of vaporization.

In various embodiments, solvent conductivity can describe how conductivethe solvent is. As electrospray works by applying a high voltage currentto the solvent at the electrospray tip, it can be desirable to limit thespray voltage when using a solvent with relatively high conductivity toavoid the solvent from becoming a conductive path for the spray current.

In various embodiments, one or more instrument control parameters maydepend on the settings of multiple sample descriptive parameters andresults effective parameters. For example, with a low volatilitysolvent, it can be desirable to increase the desolvation gastemperature, but with a compound with low thermal stability, it can bedesirable to avoid exposing the volatilized compound to hightemperatures. Thus, compound stability and solvent volatility may bothaffect the desolvation gas temperature. In another example, instrumentrobustness and solvent volatility can both affect the desolvation gasflow which can contribute to the vaporization of the solvent. Thus, bothsolvent volatility and instrument robustness can affect the desolvationgas flow needed to volatilize the solvent.

In various embodiments, an operator with limited technical experiencewith a mass spectrometry system can be more comfortable setting resultseffective parameters and sample descriptive parameters than determiningvarious instrument control parameters. Using an interface to inputresults effective parameters and sample descriptive parameters canenable a less experienced operator to use the system effectively withoutthe need for extensive experimentation to optimize the instrumentcontrol parameters.

FIG. 4 is a graph illustrating the relationship between a pressuresetting and the liquid flow rate from the chromatograph. Therelationship between the liquid flow rate and the necessary pressuresetting to achieve the optimal signal can be adjusted by changing thesolvent volatility setting.

FIG. 5 is a graph illustrating the relationship between a pressuresetting and the liquid flow rate from the chromatograph. Therelationship between the desired flow and the necessary pressure settingto achieve optimal signal can be adjusted by changing the solventvolatility setting.

FIG. 6 is a graph illustrating the relationship between a vaporizertemperature setting and the liquid flow rate from the chromatograph. Therelationship between the desired flow and the necessary temperaturesetting to achieve optimal signal can be adjusted by changing thesolvent volatility setting.

FIG. 7 illustrates a method 700 for operating a mass spectrometrysystem. At 702, the mass spectrometry control system can display a userinterface including a plurality of adjustment elements, such as knobs orsliders. The adjustment elements can be used by an operator to set oneor more results effective parameters and one or more sample descriptiveparameters. The results effective parameters can be used to set adesired result, such as sensitivity, robustness, overall rate of gasconsumption, and the like. The sample descriptive parameters can be usedto select properties of the sample, such as solvent volatility, compoundstability, adduct formation propensity, solvent conductivity, solventviscosity, compound size, and the like.

At 704, the instrument control system can receive the result effectiveparameters and sample descriptive parameters from the user interface,and at 706, the instrument control system can determine a set ofinstrument control parameters. In various embodiments, the instrumentcontrol parameters can be based on a chromatographic flow rate and canbe modified based on the result effective parameters or sampledescriptive parameters. For example, the system can determine theinstrument control parameters based on an equation relating thechromatographic flow rate to the instrument control parameter, such asnebulizing gas flow, desolvation gas flow, desolvation gas temperature,or any combination thereof. The result effective parameters or sampledescriptive parameters can apply an offset to the equation based on thesetting, thereby adjusting the instrument control parameters. In otherembodiments, the instrument control parameters can be determined basedon the result effective parameters and sample descriptive parameters.

In various embodiments, the number of instrument control parametersdetermined based on the result effective parameters and sampledescriptive parameters can be greater than the number of the resulteffective parameters and sample descriptive parameters. The instrumentcontrol parameters can control various configurable settings of theinstrument, such as gas flows (nebulizing gas, desolvation gas, sweepgas, and the like), temperatures (ion inlet temperature, desolvation gastemperature, and the like), voltages (spray voltage, ion inlet voltage,lens potentials, and the like), and the like. At 708, the sample can beanalyzed in accordance with the instrument control parameters.

Computer-Implemented System

FIG. 8 is a block diagram that illustrates a computer system 800, uponwhich embodiments of the present teachings may be implemented as whichmay incorporate or communicate with a system controller, for examplecontroller 108 shown in FIG. 1, such that the operation of components ofthe associated mass spectrometer may be adjusted in accordance withcalculations or determinations made by computer system 800. In variousembodiments, computer system 800 can include a bus 802 or othercommunication mechanism for communicating information, and a processor804 coupled with bus 802 for processing information. In variousembodiments, computer system 800 can also include a memory 806, whichcan be a random access memory (RAM) or other dynamic storage device,coupled to bus 802, and instructions to be executed by processor 804.Memory 806 also can be used for storing temporary variables or otherintermediate information during execution of instructions to be executedby processor 804. In various embodiments, computer system 800 canfurther include a read only memory (ROM) 808 or other static storagedevice coupled to bus 802 for storing static information andinstructions for processor 804. A storage device 810, such as a magneticdisk or optical disk, can be provided and coupled to bus 802 for storinginformation and instructions.

In various embodiments, computer system 800 can be coupled via bus 802to a display 812, such as a cathode ray tube (CRT) or liquid crystaldisplay (LCD), for displaying information to a computer user. An inputdevice 814, including alphanumeric and other keys, can be coupled to bus802 for communicating information and command selections to processor804. Another type of user input device is a cursor control 816, such asa mouse, a trackball or cursor direction keys for communicatingdirection information and command selections to processor 804 and forcontrolling cursor movement on display 812. This input device typicallyhas two degrees of freedom in two axes, a first axis (i.e., x) and asecond axis (i.e., y), that allows the device to specify positions in aplane.

A computer system 800 can perform the present teachings. Consistent withcertain implementations of the present teachings, results can beprovided by computer system 800 in response to processor 804 executingone or more sequences of one or more instructions contained in memory806. Such instructions can be read into memory 806 from anothercomputer-readable medium, such as storage device 810. Execution of thesequences of instructions contained in memory 806 can cause processor804 to perform the processes described herein. In various embodiments,instructions in the memory can sequence the use of various combinationsof logic gates available within the processor to perform the processesdescribe herein. Alternatively hard-wired circuitry can be used in placeof or in combination with software instructions to implement the presentteachings. In various embodiments, the hard-wired circuitry can includethe necessary logic gates, operated in the necessary sequence to performthe processes described herein. Thus implementations of the presentteachings are not limited to any specific combination of hardwarecircuitry and software.

The term “computer-readable medium” as used herein refers to any mediathat participates in providing instructions to processor 804 forexecution. Such a medium can take many forms, including but not limitedto, non-volatile media, volatile media, and transmission media. Examplesof non-volatile media can include, but are not limited to, optical ormagnetic disks, such as storage device 810. Examples of volatile mediacan include, but are not limited to, dynamic memory, such as memory 806.Examples of transmission media can include, but are not limited to,coaxial cables, copper wire, and fiber optics, including the wires thatcomprise bus 802.

Common forms of non-transitory computer-readable media include, forexample, a floppy disk, a flexible disk, hard disk, magnetic tape, orany other magnetic medium, a CD-ROM, any other optical medium, punchcards, paper tape, any other physical medium with patterns of holes, aRAM, PROM, and EPROM, a FLASH-EPROM, any other memory chip or cartridge,or any other tangible medium from which a computer can read.

In accordance with various embodiments, instructions configured to beexecuted by a processor to perform a method are stored on acomputer-readable medium. The computer-readable medium can be a devicethat stores digital information. For example, a computer-readable mediumincludes a compact disc read-only memory (CD-ROM) as is known in the artfor storing software. The computer-readable medium is accessed by aprocessor suitable for executing instructions configured to be executed.

In various embodiments, the methods of the present teachings may beimplemented in a software program and applications written inconventional programming languages such as C, C++, etc.

While the present teachings are described in conjunction with variousembodiments, it is not intended that the present teachings be limited tosuch embodiments. On the contrary, the present teachings encompassvarious alternatives, modifications, and equivalents, as will beappreciated by those of skill in the art.

Further, in describing various embodiments, the specification may havepresented a method and/or process as a particular sequence of steps.However, to the extent that the method or process does not rely on theparticular order of steps set forth herein, the method or process shouldnot be limited to the particular sequence of steps described. As one ofordinary skill in the art would appreciate, other sequences of steps maybe possible. Therefore, the particular order of the steps set forth inthe specification should not be construed as limitations on the claims.In addition, the claims directed to the method and/or process should notbe limited to the performance of their steps in the order written, andone skilled in the art can readily appreciate that the sequences may bevaried and still remain within the spirit and scope of the variousembodiments.

What is claimed is:
 1. A mass spectrometry system, comprising: aprocessor; a memory including instructions that when executed cause theprocessor to perform the steps of: determining one or more instrumentcontrol parameters based upon equations relating a chromatographicliquid flow rate to the one or more instrument control parameters;providing a user interface including one or more adjustment elements foradjusting at least one results effective parameter or at least onesample descriptive parameter, the at least one results effectiveparameter includes desired sensitivity, the at least one sampledescriptive parameter includes volatility of a sample solvent orstability of a target compound; adjusting the instrument controlparameters based on an offset determined based on the at least oneresults effective parameter or at least one sample descriptiveparameter, wherein the number of the instrument control parameters isgreater than the number of the results effective parameters and thesample descriptive parameters; and analyzing a sample while operatingaccording to the plurality of instrument control parameters.
 2. The massspectrometry system of claim 1 wherein the instrument control parametersinclude nebulizing gas flow, desolvation gas flow, sweep gas flow,desolvation gas temperature, ion inlet temperature, spray voltage,source collision induced dissociation, or any combination thereof. 3.The mass spectrometry system of claim 1 wherein the adjustment elementsinclude sliders, knobs, or any combination thereof.
 4. The massspectrometry system of claim 1 wherein the instrument control parametersinclude a gas pressure, a gas temperature, or any combination thereof.